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Characterization of gate charging N-Channel Mosfet to determine the effects of different gate bias voltages and temperature conditions

Garcia, Rommel Galang

Characterization of gate charging N-Channel Mosfet to determine the effects of different gate bias voltages and temperature conditions Rommel Galang Garcia - Manila De La Salle University 2008.

Electronics and Communications Engineering

Subjects--Uniform Titles:
Electronics and communications engineering

LC Class. No.: CD-00388t

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