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Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx

Quiray, Josselsor F.

Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx Josselsor F. Quiray - Manila De la Salle University 2010. - xii, 175p.

Electronic and Communications Engineering

Subjects--Uniform Titles:
Electronic and communications engineering

LC Class. No.: CD-00737t

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