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An Innovative backside focused ion beam application for microelectronic devices failure analysis

Endrinal, Lesly Zaren V.

An Innovative backside focused ion beam application for microelectronic devices failure analysis Lesly Zaren V. Endrinal - Manila De La Salle University 2009. - 146p.

Electronics and Communications Engineering

Subjects--Uniform Titles:
Electronics and communications engineering

LC Class. No.: CD-00849t

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