X-ray diffraction analysis of MBE-grown InxGa1-xAs/GaAs superlattices on GaAs(100) substrates (Record no. 4518)

MARC details
000 -LEADER
fixed length control field 00554nam a22001817a 4500
001 - CONTROL NUMBER
control field ched16773333
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20240425162926.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 121204t xxu||||| |||| 00| 0 eng d
050 ## - LIBRARY OF CONGRESS CALL NUMBER
Classification number T-00897
099 ## - LOCAL FREE-TEXT CALL NUMBER (OCLC)
-- 5069
-- 5069
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Fernando, Joel G.
245 ## - TITLE STATEMENT
Title X-ray diffraction analysis of MBE-grown InxGa1-xAs/GaAs superlattices on GaAs(100) substrates
Statement of responsibility, etc. Joel G. Fernando
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Diliman, Quezon City
Name of publisher, distributor, etc. University of the Philippines
Date of publication, distribution, etc. 2009
300 ## - PHYSICAL DESCRIPTION
Extent 44p.
502 ## - DISSERTATION NOTE
Dissertation note Master of Science
Degree type Physics
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Thesis and Dissertation
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Total checkouts Barcode Date last seen Price effective from Koha item type
        Commission on Higher Education Commission on Higher Education 03/16/2023   T-00897 03/16/2023 03/16/2023 Thesis and Dissertation
Commission on Higher Education Library
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C.P. Garcia Ave.,Diliman,Quezon City,Philippines
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