Garcia, Rommel Galang <br/><br/>
Characterization of gate charging N-Channel Mosfet to determine the effects of different gate bias voltages and temperature conditions 
Rommel Galang Garcia 
 - Manila  De La Salle University  2008. 
<br/><br/>Electronics and Communications Engineering 
<br/><br/><label>Subjects--Uniform Titles: </label><br/>Electronics and communications engineering
<br/><br/><label>LC Class. No.: </label>CD-00388t