TY  - BOOK
AU  - Garcia, Rommel Galang
TI  - Characterization of gate charging N-Channel Mosfet to determine the effects of different gate bias voltages and temperature conditions
AV  - CD-00388t 
PY  - 2008///
CY  - Manila
PB  - De La Salle University
KW  - Electronics and communications engineering
N1  - Electronics and Communications Engineering
ER  -