Quiray, Josselsor F. <br/><br/>
Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx 
Josselsor F. Quiray 
 - Manila  De la Salle University  2010. 
 - xii, 175p. 
<br/><br/>Electronic and Communications Engineering 
<br/><br/><label>Subjects--Uniform Titles: </label><br/>Electronic and communications engineering
<br/><br/><label>LC Class. No.: </label>CD-00737t