Endrinal, Lesly Zaren V. <br/><br/>
An Innovative backside focused ion beam application for microelectronic devices failure analysis 
Lesly Zaren V. Endrinal 
 - Manila  De La Salle University  2009. 
 - 146p. 
<br/><br/>Electronics and Communications Engineering 
<br/><br/><label>Subjects--Uniform Titles: </label><br/>Electronics and communications engineering
<br/><br/><label>LC Class. No.: </label>CD-00849t