TY  - BOOK
AU  - Endrinal, Lesly Zaren V.
TI  - An Innovative backside focused ion beam application for microelectronic devices failure analysis
AV  - CD-00849t 
PY  - 2009///
CY  - Manila
PB  - De La Salle University
KW  - Electronics and communications engineering
N1  - Electronics and Communications Engineering
ER  -