TY  - BOOK
AU  - Merin, Jovencio V.
TI  - Microcontroller robustness test device for microwave oven door system and interlocks at the Bureau of Product standards Testing Center
AV  - CD-01701t 
PY  - 2011///
CY  - Manila
PB  - De La Salle University
N1  - Master of Arts in Engineering Program/ Electronics and Communication Engineering
ER  -