| 000 | 00650nam a22001937a 4500 | ||
|---|---|---|---|
| 001 | ched13503374 | ||
| 005 | 20240425162640.0 | ||
| 008 | 110704t xxu||||| |||| 00| 0 eng d | ||
| 050 | _aCD-00849t | ||
| 099 |
_c2415 _d2415 |
||
| 100 | _aEndrinal, Lesly Zaren V. | ||
| 245 |
_aAn Innovative backside focused ion beam application for microelectronic devices failure analysis _cLesly Zaren V. Endrinal |
||
| 260 |
_aManila _bDe La Salle University _c2009. |
||
| 300 | _a146p. | ||
| 502 |
_bMaster of Science _aElectronics and Communications Engineering |
||
| 630 | _aElectronics and communications engineering | ||
| 942 | _cTD | ||
| 999 |
_c2114 _d2114 |
||