000 00658nam a22001937a 4500
001 ched18828208
005 20240425162640.0
008 110704t xxu||||| |||| 00| 0 eng d
050 _aCD-00857t
099 _c2422
_d2422
100 _aDavid, Edgar Alan R.
245 _aImplementation of core manufacturing test program for memory SPI devices using multiple tester platform system
_cEdgar Alan R. David
260 _aManila
_bDe La Salle University
_c2009.
300 _a132p.
502 _bMaster of Engineering
_aElectronic and Communications Engineering
630 _aElectronic and communications engineering
942 _cTD
999 _c2121
_d2121