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An Innovative backside focused ion beam application for microelectronic devices failure analysis Lesly Zaren V. Endrinal

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Material type: Text

TextPublication details: Manila De La Salle University 2009.Description: 146pSubject(s):

LOC classification:

Dissertation note: Master of Science Electronics and Communications Engineering

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Item type	Current library	Call number	Status	Date due	Barcode
Thesis and Dissertation	Commission on Higher Education		Available		CD-00849t

Master of Science Electronics and Communications Engineering

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