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Characterization of gate charging N-Channel Mosfet to determine the effects of different gate bias voltages and temperature conditions Rommel Galang Garcia

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Material type: Text

TextPublication details: Manila De La Salle University 2008.Subject(s):

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Dissertation note: Master of Science Electronics and Communications Engineering

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Item type	Current library	Call number	Status	Date due	Barcode
Thesis and Dissertation	Commission on Higher Education		Available		CD-00388t

Master of Science Electronics and Communications Engineering

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