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Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx Josselsor F. Quiray

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Material type: Text

TextPublication details: Manila De la Salle University 2010.Description: xii, 175pSubject(s):

LOC classification:

Dissertation note: Master of Engineering Electronic and Communications Engineering

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Thesis and Dissertation	Commission on Higher Education		Available		CD-00737t

Master of Engineering Electronic and Communications Engineering

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